Magnification 8X-800000X Scanning Electron Microscope 1.5-3nm Resolution with Optional BSE,EDS,EBSD and CL
M22005 electron microscope operating software can be switched in Chinese/English with modular layout. This software supports real-time simultaneous display of 5 images, 4 channels plus CCD window, and powerful auxiliary functions such as synthesis of secondary electron image and backscattered electron image, multi-point size measurement, text annotation of electron microscope image, vacuum map display, CCD window display, etc., to meet the individual needs of different users. Automatic functions: automatic filament, high voltage, focusing, brightness/contrast adjustment, astigmatism, electron beam centering, automatic correction of electron gun, fault detection, optional 3D reconstruction, etc. Saved pictures: 16384x16384pixel BMP, GIF, TIF, JPG, MNG, ICOCUR, TGA, PCX, JP2, JPC, PGX, RAS, PNM, SKA, SEM
Specials:
- Magnification Max 800000X.
- Signal Detection: Ultra Vacuum Secondary Electron Detector (With detector perotection function).
- Accelerating Voltage: 0~30KV, High image resolution.
- BSE/EDS/EBSD/CL is optional, for component analysis.
- High Vacuum System.
- Five Axes Encentric Motorized Stage.
| Item | Specification | M22005 |
| Resolution | 1.5nm@15kV(SE), 3nm@30kV(BSE) | ● |
| Magnification | 8X~800000X, Displayed Magnification: Magnification is defined with a display size 127mm*211mm | ● |
| Accelerating Voltage | 0~30kV | ● |
| Signal Detection | Ultra Vacuum Secondary Electron Detector (With detector perotection function) | ● |
| Electron Gun | Schotty Field Emission ELectron Gun | ● |
| Auto Function | Focus,Bright/Contrast,Stigmator,Alignment etc | ● |
| StageSystem/Movement | Standard Manual Stage | ● |
| X: 0~80mm | ● |
| Y: 0~60mm | ● |
| Z: 0~50mm | ● |
| R: 360° | ● |
| T: -5°~90° | ● |
| Max Sample Diameter: 175mm | ● |
| Max Sample Height: 40mm | ● |
| Optional Encentric Motorized Stage | ○ |
| X: 0~80mm X: 0~150mm | ○ |
| Y: 0~50mm Y: 0~150mm | ○ |
| Z: 0~30mm Z: 0~60mm | ○ |
| R: 360° R: 360° | ○ |
| T: -5°~70° T: -5°~70° | ○ |
| Max Sample Diameter: 175mm Max Sample Diameter: 340mm | ○ |
| Max Sample Height: 20mm Max Sample Height: 50mm | ○ |
| Vacuum system | 2 Ion Pump,1TMP,1RP | ● |
| Optional Detector | BSEEDSEBSDCL | ○ |
| Optional Accessories | Pre-Vacuum Chamber/EBL/Cryo Stage/Nano Manipulator/Tensile Stage/ Control Panel/Track Ball | ○ |
Note: ● means standard, ○ means optional
Gallery
Image Processing Software
Product Tags:
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Magnification 8X-800000X Scanning Electron Microscope 1.5-3nm Resolution BSE Images
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